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005 20170113102446.0
008 170113b xxu||||| |||| 00| 0 eng d
040 _cIITK
041 _aeng
082 _a004.24
_bIn8
245 1 _aProceedings : International conference on measurement and modeling of computer systems May 23-26, 1996 (USA)
260 _bACM Press, New York
_c1996
300 _axii, 279p.
500 _aIncludes Index
650 _aComputer - Valuation - Congresses
650 _aSigmetrics
942 _cBK
999 _c467065
_d467065