000 00529 a2200181 4500
005 20170112160611.0
008 170112b xxu||||| |||| 00| 0 eng d
040 _cIITK
041 _aeng
082 _a004.24
_bIn8
245 1 _aACM sigmetrics conference on measurement and modeling of computer systems : proceedings May 16-20, 1994 (USA)
260 _bACM Press, New York
_c1994
300 _axi, 294p.
500 _aIncludes Index
650 _aComputer - Valuation - Congresses
650 _aSigmetrics
942 _cBK
999 _c467064
_d467064