| 000 | 00685pam a2200193a 44500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 082 |
_a530.85 _bUn3mo |
||
| 111 | 0 |
_aSymposium on Trace Characterization: Chemical and Physics _cWashington _dOctober 3-7, 1966 |
|
| 245 | 0 |
_aTrace characterization _bchemical and physical _cedited by W. Wayne Meinke and Bourdon F. Scribner |
|
| 260 |
_aWashington _bNational Bureau Of Standards _c1967 |
||
| 300 | _axviii, 580p | ||
| 650 |
_aCharacterization, Trace _xChemical and physical |
||
| 650 |
_aChemical and physical _xTrace characterization |
||
| 700 | _aMeinke, W. Wayne., Ed. | ||
| 700 | _aScribner, Bourdon F., Ed. | ||
| 942 | _cBK | ||
| 999 |
_c450171 _d450171 |
||