000			00490pam a2200133a 44500
082			_a621.38152 _bSe52
100			_a
245	1		_aSEMICONDUCTOR RELIABILITY
260			_aElizabeth, N. J. _bEngineering Pub. _cc1961
300			_av.
500			_aV. 1. : Based On The Conf. On Reliability Of Semiconductor Devices, 1961, Sponsored By The Working Group On Semiconductor Devices, Advisory Group On Electron Tubes, Dept. Of Defence. Ed. By John E. Sh
964			_gCIRC
997			_a73500 s C
999			_c436921 _d436921