000 | 00440pam a2200121a 44500 | ||
---|---|---|---|
082 |
_aJPL _b515 |
||
100 | _aNash,Douglas B | ||
245 | 1 | _aNEW TECHNIQUE FOR QUANTITATIVE SIO2 DETERMINATIONS OF SOLICATE MATERIALS BY X-RAY DIFFRACTION ANALYSIS OF GASS | |
260 |
_a _bJet Propulsion Laboratory, Pasadena, Ca _c1963 |
||
500 | _aBound With Jpl 512-514,516-540.Lack No-519,522-523,526,529,531,536-537 | ||
964 | _gCIRC | ||
997 | _aTR17904 C | ||
999 |
_c404407 _d404407 |