000 00440pam a2200121a 44500
082 _aJPL
_b515
100 _aNash,Douglas B
245 1 _aNEW TECHNIQUE FOR QUANTITATIVE SIO2 DETERMINATIONS OF SOLICATE MATERIALS BY X-RAY DIFFRACTION ANALYSIS OF GASS
260 _a
_bJet Propulsion Laboratory, Pasadena, Ca
_c1963
500 _aBound With Jpl 512-514,516-540.Lack No-519,522-523,526,529,531,536-537
964 _gCIRC
997 _aTR17904 C
999 _c404407
_d404407