000 00356pam a2200145a 44500
082 _aBTS
_bMONO 5205
100 _aJaccodine,R J
245 1 _aMEASUREMENT OF STRAINS AT SI-SIO2 INTERFACE
260 _a
_b
_c1966
300 _a6
500 _aBound With Bts Mono 5200-5204,5206-5219
700 _aSchlegel,W A
964 _gCIRC
997 _aTR20021 C
999 _c403615
_d403615