| 000 | 00349pam a2200133a 44500 | ||
|---|---|---|---|
| 082 |
_aBTS _bMONO 3380 |
||
| 100 | _aWaltz,M C | ||
| 245 | 1 | _aMICROWAVE IMPEDANCE MEASUREMENT IN JUNCTION REGION OF A SEMICONDUCTOR | |
| 260 |
_a _b _c1959 |
||
| 300 | _a8 | ||
| 500 | _aBound With Bts Mono 3376-3379,3381-3400 | ||
| 964 | _gCIRC | ||
| 997 | _aTR19209 C | ||
| 999 |
_c403277 _d403277 |
||