| 000 | 00613pam a2200193a 44500 | ||
|---|---|---|---|
| 005 | 20200703121326.0 | ||
| 008 | 200703b xxu||||| |||| 00| 0 eng d | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 100 | _aSokoloski, Martin M. | ||
| 245 | 1 |
_aStructure and kinetics of defects in silicon [NASA TN D-4154] _cMartin M. Sokoloski |
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| 260 |
_bNasa _c1967 _aWashington, D. C. |
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| 300 | _a24p | ||
| 440 | _aNational Aeronautics and Space Administration (NASA) | ||
| 500 | _aBound With Nasa Tn D-4151-4153,4155-4160.Lack No-4155. | ||
| 505 | _aTechnical Note D-4154 | ||
| 650 | _aStructure | ||
| 942 | _cREF | ||
| 999 |
_c400733 _d400733 |
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