| 000 | 00660pam a2200205a 44500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20221125145438.0 | ||
| 008 | 221125b xxu||||| |||| 00| 0 eng d | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 100 | _aKobren, Lawrence | ||
| 245 | 1 | _aTHE USE OF THE ELECTRON PROBE MICROANALYZER IN MATERIALS RESEARCH AND DEVELOPMENT [NASA TN D-4526] | |
| 260 |
_bNational Aeronautics and Space Administration _c1968 _aWashington, D.C. |
||
| 300 | _a23p | ||
| 440 | _aNational Aeronautics and Space Administration | ||
| 440 | _aNASA Technical Note | ||
| 500 | _aBound vol. contains NASA TN D 4521-4530 | ||
| 650 | _aMicroanalyzer | ||
| 942 | _cTR | ||
| 999 |
_c400637 _d400637 |
||