| 000 | 00840pam a2200229a 44500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 110 | _aWashington. National Aeronautics and Space Administration (NASA) | ||
| 245 | 1 |
_aNASA Technical Note [NASA TN D-5669]: Evaluation of a flash x-ray technique for recession measurements in ablative materials _cby William D. Brewer and Philip C. Kassel |
|
| 260 |
_bNASA _c1970 _aWashington |
||
| 300 | _a22p | ||
| 440 | _aNational Aeronautics and Space Administration | ||
| 440 | _aNASA Technical Note | ||
| 500 | _aBound together NASA TN D-5660 to 5669 | ||
| 500 | _aBound vol. Acc. No. 101185 contains Acc. No. TR14371 to TR14379 | ||
| 650 | _aAblative materials | ||
| 650 | _aRecession measurements | ||
| 700 | _aBrewer, William D. | ||
| 700 | _aKassel, Philip C. | ||
| 942 | _cBK | ||
| 999 |
_c398675 _d398675 |
||