000 00318pam a2200121a 44500
082 _aNASA
_bCR-702
100 _aRyerson,C M
245 1 _aPROJECT "DIODE RELIABILITY PREDICTION TECHNIQUE"
260 _a
_bNasa, Washington, D.C.
_c
500 _aBound With Nasa Cr-701, 703-05
964 _gCIRC
997 _aTR11923 C
999 _c397311
_d397311