000 00330pam a2200121a 44500
082 _aNASA
_bCR-1754-55 -
100 _aHeffner,William A
245 1 _aAUTOMATIC TEST EQUIPMENT FOR ELECTRONIC COMPONENTS
260 _a
_bNasa,Washington, D.C.
_c1971
500 _aBound With Nasa Cr-1751-59
964 _gCIRC
997 _aTR8537 C
999 _c393719
_d393719