000			00436pam a2200145a 44500
082			_aNASA _bCR-1535 -
100			_aWeir,David H
245	1		_aTHE MEASUREMENT AND ANALYSIS OF PILOT SCANNING AND CONTROL BEHAVIOR DURING SIMULATED INSTRUMENT APPROACHES
260			_a _bNasa, Washington, D.C. _c1970
300			_aXII,100
500			_aBound With Nasa Cr-1531-39
700			_aKlein,Richard H
964			_gCIRC
997			_aTR9300 C
999			_c392917 _d392917