000 00459pam a2200145a 44500
082 _aTR
_bRL-64-737
100 _aKeane,Leo M.
245 1 _aCONFIDENCE LEVEL FOR THE SAMPLE MEAN AND STANDARD DEVIATION OF A RAYLEIGH PROCESS
260 _a
_bUs Air Force Aerospace Research,, Bedford
_c1964
300 _a7
440 _aAir Force Cambridge Research Laboratories-64-737
_v
500 _aBound With: Afcrl-64-713-791
964 _gCIRC
997 _aTR5691 C
999 _c392359
_d392359