000 | 00459pam a2200145a 44500 | ||
---|---|---|---|
082 |
_aTR _bRL-64-737 |
||
100 | _aKeane,Leo M. | ||
245 | 1 | _aCONFIDENCE LEVEL FOR THE SAMPLE MEAN AND STANDARD DEVIATION OF A RAYLEIGH PROCESS | |
260 |
_a _bUs Air Force Aerospace Research,, Bedford _c1964 |
||
300 | _a7 | ||
440 |
_aAir Force Cambridge Research Laboratories-64-737 _v |
||
500 | _aBound With: Afcrl-64-713-791 | ||
964 | _gCIRC | ||
997 | _aTR5691 C | ||
999 |
_c392359 _d392359 |