000 00664pam a2200205a 44500
008 160408b2013 xxu||||| |||| 00| 0 eng d
020 _a9783527335015
040 _aP K Kelkar Library, IIT Kanpur
082 _a621.381
_bR279
100 _a
245 0 _aReliability of MEMS
_btesting of materials and devices
_cedited by Osamu Tabata and Toshiyuki Tsuchiya
260 _aGermany
_bWiley-Vch
_c2013
300 _axx, 303p
440 _aAdvanced Micro And Nanosystems
_v
650 _aMicroelectromechanical systems -- Reliability.
650 _aMEMS.
700 _aTabata, Osamu, Ed.
700 _aToshiyuki, Tsuchiya, Ed.
997 _aA180313 C
999 _c376011
_d376011