000 | 00664pam a2200205a 44500 | ||
---|---|---|---|
008 | 160408b2013 xxu||||| |||| 00| 0 eng d | ||
020 | _a9783527335015 | ||
040 | _aP K Kelkar Library, IIT Kanpur | ||
082 |
_a621.381 _bR279 |
||
100 | _a | ||
245 | 0 |
_aReliability of MEMS _btesting of materials and devices _cedited by Osamu Tabata and Toshiyuki Tsuchiya |
|
260 |
_aGermany _bWiley-Vch _c2013 |
||
300 | _axx, 303p | ||
440 |
_aAdvanced Micro And Nanosystems _v |
||
650 | _aMicroelectromechanical systems -- Reliability. | ||
650 | _aMEMS. | ||
700 | _aTabata, Osamu, Ed. | ||
700 | _aToshiyuki, Tsuchiya, Ed. | ||
997 | _aA180313 C | ||
999 |
_c376011 _d376011 |