| 000 | 00912pam a2200253a 44500 | ||
|---|---|---|---|
| 008 | 160408b2011 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9781441982964 | ||
| 040 | _aP K Kelkar Library, IIT Kanpur | ||
| 082 |
_a621.381548 _bT233m |
||
| 100 | _aTehranipoor, Mohammad | ||
| 245 | 0 |
_aTest and diagnosis for small-delay defects _cMohammad Tehranipoor, Ke Peng and Krishnendu Chakrabarty |
|
| 260 |
_aNew York _bSpringer _c2011 |
||
| 300 | _axviii, 212p | ||
| 650 | _aIntegrated circuits--Fault tolerance | ||
| 650 | _aIntegrated circuits--Testing | ||
| 650 | _aDelay faults (Semiconductors) | ||
| 650 | _aIntegrated circuits--Very large scale integration--Defects | ||
| 650 | _aIntegrated circuits--Very large scale integration--Testing | ||
| 650 | _aEngineering | ||
| 650 | _aOperating systems (Computers) | ||
| 650 | _aSystems engineering | ||
| 700 | _aPeng, Ke | ||
| 997 | _aA176091 s C | ||
| 999 |
_c372248 _d372248 |
||