| 000 | 00571pam a2200181a 44500 | ||
|---|---|---|---|
| 008 | 160408b1989 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0890062846 | ||
| 040 | _aIIT, Kanpur | ||
| 082 |
_a621.38152 _bM583 |
||
| 100 | _a | ||
| 245 | 0 |
_aMicroelectronic reliability _cedited by Edward B. Hakim |
|
| 260 |
_aNorwood _bArtech House _c1989 |
||
| 300 | _axviii, 374p. | ||
| 505 | _aContents: Vol.1 - Reliability, test and diagnostics | ||
| 650 | _aSemiconductors--Reliability | ||
| 700 | _aHakim, Edward B., Ed. | ||
| 997 | _aA107346 vol.1 s C | ||
| 999 |
_c369382 _d369382 |
||