000 00495pam a2200157a 44500
008 160408b2010 xxu||||| |||| 00| 0 eng d
020 _a9789814277105
040 _aIIT, Kanpur
082 _a621.38152
_bJ641r
100 _aJohnston, Allan
245 1 _aReliability and radiation effects in compound semiconductors
_cAllan Johnston
260 _aNew Jersey
_bWorld Scientific
_c2010
300 _axii, 363p
650 _aRadiation effects
997 _aA170796 s C
999 _c368412
_d368412