| 000 | 00610pam a2200181a 44500 | ||
|---|---|---|---|
| 008 | 160408b2008 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780387747460 | ||
| 040 | _aIIT, Kanpur | ||
| 082 |
_a620.5 _bEm32 |
||
| 100 | _a | ||
| 245 | 0 |
_aEmerging nanotechnologies _btest, defect tolerance and reliability _cedited by Mohammad Tehranipoor |
|
| 260 |
_aNew York _bSpringer _c2008 |
||
| 300 | _axii, 405p | ||
| 440 |
_aFrontiers In Electronic Testing / Edited By Vishwani Agrawal _vNo.37 |
||
| 650 | _aNanotechnology | ||
| 700 | _aTehranipoor, Mohammad, Ed. | ||
| 997 | _aA167523 s C | ||
| 999 |
_c365843 _d365843 |
||