000 00635pam a2200181a 44500
008 160408b2009 xxu||||| |||| 00| 0 eng d
020 _a9780817645922
040 _aIIT, Kanpur
082 _a511.8
_bD262
100 _a
245 1 _aData modeling for metrology and testing in measurement science
_cedited by Franco Pavese and Alistair B. Forbes
260 _aBoston
_bBirkhauser
_c2009
300 _axvii, 489p
440 _aModeling And Simulation In Science, Engineering And Technology / Edited By Nicola Bellomo
_v
650 _aMetrology
700 _aPavese, Franco, Ed.
997 _aA166251 C
999 _c364855
_d364855