000 00467pam a2200145a 44500
008 160408b2007 xxu||||| |||| 00| 0 eng d
020 _a9780849330575
082 _a621.3815
_bP414d
100 _aPerelroyzen, Evgeni
245 _aDigital integrated circuits
_bdisign-for-test using simulink and stateflow
_cEvgeni Perelroyzen
260 _aBoca Raton
_bCrc Press
_c2007
300 _a320p
650 _aDigital integrated circuits -- Testing
997 _aA164170 C
999 _c363554
_d363554