| 000 | 00628pam a2200181a 44500 | ||
|---|---|---|---|
| 008 | 160408b2009 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9781420043761 | ||
| 040 | _aIIT, Kanpur | ||
| 082 |
_a621.381 _bD361 |
||
| 100 | _a | ||
| 245 |
_aDefects in microelectronic materials and devices _cedited by Daniel M. Fleetwood, Sokrates T. Pantelides and Ronald D. Schrimpf |
||
| 260 |
_aBoca Raton _bCrc Press _c2009 |
||
| 300 | _axvi, 753p | ||
| 650 | _aMicroelectronics - Materials - Testing | ||
| 651 | _aIntegrated circuits - Defects | ||
| 700 | _aFleetwood, Daniel M., Ed. | ||
| 997 | _aA165011 C | ||
| 999 |
_c363411 _d363411 |
||