000 00443pam a2200169a 44500
008 160408b2009 xxu||||| |||| 00| 0 eng d
020 _a9781856175302
082 _a681.2
_bT286
100 _a
245 _aTest and measurement
_cJon Wilson...[et al].
260 _aAmsterdam
_bElsevier
_c2009
300 _axviii,891p
440 _aThe Newnes Know It All Series
_v
650 _aTesting
700 _aWilson, Jon
997 _aA162916 C
999 _c362098
_d362098