| 000 | 00619pam a2200217a 44500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20230817142029.0 | ||
| 008 | 160408b2008 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9783540738855 | ||
| 040 | _cIITK | ||
| 041 | _aeng | ||
| 082 |
_a620.11299 _bF959t3 |
||
| 245 | 1 |
_aTransmission electron microscopy and diffractometry of materials [3rd ed.] _cFultz, Brent; Howe, James |
|
| 250 | _a3rd ed. | ||
| 260 |
_aBerlin _bSpringer-Verlag _c2008 |
||
| 300 | _axix, 758p | ||
| 650 | _aMaterials -- Microscopy | ||
| 650 | _aTransmission electron microscopy | ||
| 650 | _aX-Ray diffractometer | ||
| 942 | _cBK | ||
| 999 |
_c360080 _d360080 |
||