000			00739pam a2200217a 44500
008			160408b2007 xxu||||| |||| 00| 0 eng d
020			_a9780387465463
082			_a621.3815 _bSA14D2
100			_aSachdev,Manoj,Gyvez,Jose Pineda De
245	1		_aDEFECT-ORIENTED TESTING FOR NANO-METRIC CMOS VLSI CIRCUITS
250			_a2nd
260			_a _bSpringer,Aa Dordrecht _c2007
300			_axx,328
440			_aFrontiers In Electronic Testing _v
650			_aMetaloxide Semiconductors, Complementary -- Testing
650			_aMetaloxide Semiconductors, Complementary -- Defects
650			_aIntegrated Circuits -- Very Largescale Integration -- Testing
700			_aAgarwal,Vishwani D.
964			_gCIRC
997			_aA159498 s C
999			_c358645 _d358645