000 00495pam a2200157a 44500
008 160408b2006 xxu||||| |||| 00| 0 eng d
020 _a3540284052
082 _a502.82
_bK166A
100 _aKaupp,G.
245 1 _aATOMIC FORCE MICROSCOPY, SCANNING NEARFIELD OPTICAL MICROSCOPY AND NANOSCRATCHING
_cAPPLICATION TO ROUGH AND NATURAL SURFACES
260 _a
_bSpringer-Verlag, Berlin
_c2006
300 _axii,292
650 _aAtomic Force Microscopy
964 _gCIRC
997 _aA156436 C
999 _c358091
_d358091