000 | 00613pam a2200181a 44500 | ||
---|---|---|---|
008 | 160408b2006 xxu||||| |||| 00| 0 eng d | ||
020 | _a0198570546 | ||
082 |
_a536.54 _bEK34E |
||
100 | _aEkin,Jack W. | ||
245 | 1 |
_aEXPERIMENTAL TECHNIQUES FOR LOW-TEMPERATURE MEASUREMENTS _cCRYOSTAT DESIGN, MATERIAL PROPERTIES, AND SUPERCONDUCTOR CRITICAL-CURRENT TESTING |
|
260 |
_a _bOxford Univ. Pr.,Oxford _c2006 |
||
300 | _axxviii,673 | ||
650 | _aLow Temperatures -- Measurement | ||
650 | _aLow Temperatures -- Instrument | ||
650 | _aLow Temperature Research | ||
964 | _gCIRC | ||
997 | _aA157913 C | ||
999 |
_c355508 _d355508 |