000 00613pam a2200181a 44500
008 160408b2006 xxu||||| |||| 00| 0 eng d
020 _a0198570546
082 _a536.54
_bEK34E
100 _aEkin,Jack W.
245 1 _aEXPERIMENTAL TECHNIQUES FOR LOW-TEMPERATURE MEASUREMENTS
_cCRYOSTAT DESIGN, MATERIAL PROPERTIES, AND SUPERCONDUCTOR CRITICAL-CURRENT TESTING
260 _a
_bOxford Univ. Pr.,Oxford
_c2006
300 _axxviii,673
650 _aLow Temperatures -- Measurement
650 _aLow Temperatures -- Instrument
650 _aLow Temperature Research
964 _gCIRC
997 _aA157913 C
999 _c355508
_d355508