| 000 | 00558pam a2200181a 44500 | ||
|---|---|---|---|
| 008 | 160408b2005 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0 387 25800 0 | ||
| 082 |
_a502.825 _bEG28P |
||
| 100 | _aEgerton,Ray F. | ||
| 245 | 1 |
_aPHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY _cAN INTRODUCTION TO TEM, SEM AND AEM |
|
| 260 |
_a _bSpringer Science+Business Media Inc., New York _c2005 |
||
| 300 | _av,202 | ||
| 650 | _aScanning Electron Microscopy | ||
| 650 | _aElectron Microscopy | ||
| 650 | _aX-Ray Microanalysis | ||
| 964 | _gCIRC | ||
| 997 | _aA153884 C | ||
| 999 |
_c354307 _d354307 |
||