000 00862pam a2200253a 44500
003 OSt
008 160408b2005 xxu||||| |||| 00| 0 eng d
020 _a981256697X
040 _cIIT Kanpur
041 _aeng
082 _a519.5
_bD459l
100 _aDeshpande, Jayant V.
245 1 _aLife time data
_bstatistical models and methods
_cJayant V. Deshpande and Sudha G. Purohit
260 _bWorld Scientific
_c2005
_aNew Jersey
300 _aix,247p
440 _aSeries on quality reliability and engineering statistics
490 _a / edited by M. Xie, T. Bendell [and] A. P. Basu
_v ; v.11
500 _aIncludes bibliographical references and index
650 _aFailure time aata analysis
650 _aSurvival analysis (Biometry)
650 _aReliability (Engineering) -- Statistical methods
700 _aPurohit, Sudha G.
942 _cBK
999 _c352112
_d352112