000 | 00862pam a2200253a 44500 | ||
---|---|---|---|
003 | OSt | ||
008 | 160408b2005 xxu||||| |||| 00| 0 eng d | ||
020 | _a981256697X | ||
040 | _cIIT Kanpur | ||
041 | _aeng | ||
082 |
_a519.5 _bD459l |
||
100 | _aDeshpande, Jayant V. | ||
245 | 1 |
_aLife time data _bstatistical models and methods _cJayant V. Deshpande and Sudha G. Purohit |
|
260 |
_bWorld Scientific _c2005 _aNew Jersey |
||
300 | _aix,247p | ||
440 | _aSeries on quality reliability and engineering statistics | ||
490 |
_a / edited by M. Xie, T. Bendell [and] A. P. Basu _v ; v.11 |
||
500 | _aIncludes bibliographical references and index | ||
650 | _aFailure time aata analysis | ||
650 | _aSurvival analysis (Biometry) | ||
650 | _aReliability (Engineering) -- Statistical methods | ||
700 | _aPurohit, Sudha G. | ||
942 | _cBK | ||
999 |
_c352112 _d352112 |