| 000 | 00619pam a2200205a 44500 | ||
|---|---|---|---|
| 008 | 160408bc1998 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0824790391 | ||
| 082 |
_a541.33 _bEL25 |
||
| 100 | _aHiroyuki Ohshima,Kunio Furusawa | ||
| 245 | 1 |
_aELECTRICAL PHENOMENA AT INTERFACES _cFUNDAMENTALS, MEASUREMENTS, AND APPLICATIONS |
|
| 250 | _a2nd.& rev.expan | ||
| 260 |
_a _bMarcel Dekker, New York _cc1998 |
||
| 300 | _axiii,628 | ||
| 440 |
_aSurfactant Science Series _vV.76 |
||
| 650 | _aSurface Chemistry | ||
| 650 | _aElectric Double Layer | ||
| 700 | _aFurusawa,Kunio | ||
| 964 | _gCIRC | ||
| 997 | _aA136754 C | ||
| 999 |
_c348056 _d348056 |
||