| 000 | 00714pam a2200217a 44500 | ||
|---|---|---|---|
| 005 | 20190312094315.0 | ||
| 008 | 160408b1992 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0750691689 | ||
| 040 | _cIIT Kanpur | ||
| 041 | _aeng | ||
| 082 |
_a620.44 _bEn19 |
||
| 245 | 1 |
_aEncyclopedia of materials characterization _bsurfaces, interfaces, thin films _cedited by C. Richard Brundle, Charles A. Evans and Shaun Wilson |
|
| 260 |
_aBoston _bButterworth-Heinemann _c1992 |
||
| 300 | _axix, 751p | ||
| 440 | _aMaterials characterization series | ||
| 650 | _aSurfaces (Technology) -- Testing | ||
| 700 | _aBrundle, C. Richard [ed.] | ||
| 700 | _aEvans, Charles A [ed.] | ||
| 700 | _aWilson, Shaun [ed.] | ||
| 942 | _cREF | ||
| 999 |
_c346794 _d346794 |
||