000 00566pam a2200193a 44500
008 160408b2004 xxu||||| |||| 00| 0 eng d
020 _a3540206620
082 _a620.5
_bN157A
100 _aAlexe,M.
245 1 _aNANOSCALE CHARACTERISATION OF FERROELECTRIC MATERIALS
_cSCANNING PROBE MICROSCOPY APPROACH
260 _a
_bSpringer-Verlag, Berlin
_c2004
300 _axiii,282
440 _aNanoscience And Technology
_v
650 _aNanostructured Materials
650 _aNanotechnology
700 _aGruverman,A.
964 _gCIRC
997 _aA151128 C
999 _c346012
_d346012