| 000 | 00496pam a2200193a 44500 | ||
|---|---|---|---|
| 005 | 20170207125614.0 | ||
| 008 | 160408b2001 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0471241415 | ||
| 040 | _cIITK | ||
| 041 | _aeng | ||
| 082 |
_a530.4275 _bIN2 |
||
| 100 | _aOrlando, Auciello, Alan R Krauss | ||
| 245 | 1 | _aIN SITU REAL - TIME CHARACTERIZATION OF THIN FILMS | |
| 260 |
_bJohn Wiley, New York _c2001 |
||
| 300 | _axi,263 | ||
| 650 | _aThin Films | ||
| 700 | _aKrauss,Alan R | ||
| 942 | _cBK | ||
| 999 |
_c335487 _d335487 |
||