| 000 | 00683pam a2200193a 44500 | ||
|---|---|---|---|
| 008 | 160408bc1993 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a079239352X | ||
| 082 |
_a621.395 _bL492H |
||
| 100 | _aLeblebici,Yusuf | ||
| 245 | 1 | _aHOT-CARRIER RELIABILITY OF MOS VLSI CIRCUITS | |
| 260 |
_a _bKluwer Academic Publishers, Boston _cc1993 |
||
| 300 | _axvi,212 | ||
| 650 | _aIntegrated Circuits -- Very Large Scale Integration -- Defects -- Mathematical Models | ||
| 650 | _aMetal Oxide Semiconductors -- Reliability -- Mathematical Models | ||
| 650 | _aHot-Carriers -- Reliability -- Mathematical Models | ||
| 700 | _aKang,Sung-Mo (Steve) | ||
| 964 | _gCIRC | ||
| 997 | _aA132867 C | ||
| 999 |
_c335357 _d335357 |
||