000 00458pam a2200169a 44500
008 160408b2000 xxu||||| |||| 00| 0 eng d
020 _a3908450446
082 _a620.112972
_bSP31
100 _aR P Agarwala
245 1 _aSPECIAL DEFECTS IN SEMICONDUCTING MATERIALS
260 _a
_bScitec Publications, Zuerich
_c2000
300 _avii,270
650 _aSemiconductors -- Defects
700 _aAgarwala,R P
964 _gCIRC
997 _aA131368 s C
999 _c334833
_d334833