| 000 | 00499pam a2200193a 44500 | ||
|---|---|---|---|
| 008 | 160408b1998 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0070576971 | ||
| 082 |
_a621.381520287 _bR876S |
||
| 100 | _aRunyan,W R | ||
| 245 | 1 | _aSEMICONDUCTOR MEASUREMENTS AND INSTRUMENTATION | |
| 250 | _a2nd | ||
| 260 |
_a _bMcgraw-Hill, New York _c1998 |
||
| 300 | _ax,454 | ||
| 650 | _aSemiconductors | ||
| 650 | _aPhysical Measurements | ||
| 700 | _aShaffer,T J | ||
| 964 | _gCIRC | ||
| 997 | _aA127412 C | ||
| 999 |
_c330830 _d330830 |
||