| 000 | 00510pam a2200169a 44500 | ||
|---|---|---|---|
| 008 | 160408b1998 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0824701828 | ||
| 082 |
_a621.3815 _bD281R |
||
| 100 | _aDavid,Rene | ||
| 245 | 1 |
_aRANDOM TESTING OF DIGITAL CIRCUITS _cTHEORY AND APPLICATIONS |
|
| 260 |
_a _bMarcel Dekker, New York _c1998 |
||
| 300 | _axix,475 | ||
| 500 | _aIncludes Bibliographical References And Index | ||
| 650 | _aDigital Integrated Circuits - Testing | ||
| 964 | _gCIRC | ||
| 997 | _aA125903 C | ||
| 999 |
_c330067 _d330067 |
||