000 00477pam a2200169a 44500
008 160408bc1997 xxu||||| |||| 00| 0 eng d
020 _a0340677716
082 _a621.395
_bB852M
100 _aBuchanan,W.
245 1 _aMICROELECTRONIC SYSTEMS
_cDESIGN, MODELLING AND TESTING
260 _a
_bArnold, London
_cc1997
300 _axiv,314
500 _aIncludes Bibliographical References And Index
650 _aMicroelectronics
964 _gCIRC
997 _aA124836 C
999 _c329444
_d329444