000			00495pam a2200169a 44500
008			160408b1988 xxu||||| |||| 00| 0 eng d
020			_a0134988663
082			_a621.38173 _bF434i
100			_aFeugate, Robert J.
245	1		_aINTRODUCTION TO VLSI TESTING
260			_aEnglewood Cliffs _bPrentice Hall _c1988
300			_axiii,226
650			_aIntegrated Circuits -- Very Large Scale Integration -- Testing
700			_aMcintyre, Steven M.
964			_gCIRC
997			_aA102695 s C
999			_c327834 _d327834