000 00480pam a2200169a 44500
008 160408bc1987 xxu||||| |||| 00| 0 eng d
020 _a0124967533
082 _a621.38173
_bD492
100 _aMiller, D. M.
245 1 _aDEVELOPMENTS IN INTEGRATED CIRCUIT TESTING
260 _aLondon
_bAcademic Pr.
_cc1987
300 _ax,440
440 _aPerspectives In Computing
_vV. 18
650 _aDigital Integrated Circuits -- Testing
964 _gCIRC
997 _aA100700 s C
999 _c327832
_d327832