000			00575pam a2200181a 44500
008			160408bc1990 xxu||||| |||| 00| 0 eng d
020			_a079239058X
082			_a621.38173 _bB469h
100			_aBhattacharya, Debashis
245	1		_aHIERARCHICAL MODELING FOR VLSI CIRCUIT TESTING
260			_aBoston _bKluwer Academic Pub. _cc1990
300			_ax,159
650			_aVery Large Scale Integration -- Testing
650			_aIntegrated Circuits -- Very Large Scale Integration -- Computer Simulation
700			_aHayes, John P.
964			_gCIRC
997			_aA113644 C
999			_c327830 _d327830