| 000 | 00583pam a2200181a 44500 | ||
|---|---|---|---|
| 008 | 160408bc1989 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0890063508 | ||
| 082 |
_a621.3817 _bM5831E |
||
| 100 | _aPollino, Emiliano | ||
| 245 | 1 | _aMICROELECTRONICS RELIABILITY | |
| 260 |
_aNoorwood, Ma. _bArtech _cc1989 |
||
| 300 | _av. | ||
| 500 | _aContents : V. 1. Reliability, Test & Diagnostics -- V. 2. Integrity Assessment & Assurance | ||
| 650 | _aSemiconductors-Reliability | ||
| 650 | _aElectronic Apparatus And Appliances-Reliability | ||
| 964 | _gCIRC | ||
| 997 | _aA109276 v. 2 s C | ||
| 999 |
_c327715 _d327715 |
||