| 000 | 00469pam a2200169a 44500 | ||
|---|---|---|---|
| 008 | 160408bc1990 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0471511048 | ||
| 082 |
_a621.38152 _bSch75s |
||
| 100 | _aSchroder, Dieter K. | ||
| 245 | 1 | _aSEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION | |
| 260 |
_aNew York _bJohn Wiley _cc1990 |
||
| 300 | _axv,599 | ||
| 650 | _aSemiconductors | ||
| 650 | _aSemiconductors -- Testing | ||
| 964 | _gCIRC | ||
| 997 | _aA110641 Text T | ||
| 999 |
_c327563 _d327563 |
||