| 000 | 00557pam a2200181a 44500 | ||
|---|---|---|---|
| 008 | 160408bc1990 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0716781794 | ||
| 082 |
_a621.3815 _bAb82d |
||
| 100 | _aAbramovici, Miron | ||
| 245 | 1 | _aDIGITAL SYSTEMS TESTING AND TESTABLE DESIGN | |
| 260 |
_aNew York _bComputer Science Press _cc1990 |
||
| 300 | _axxi,653 | ||
| 650 | _aDigital Integrated Circuits -- Testing | ||
| 650 | _aDigital Integrated Circuits -- Design And Construction | ||
| 700 | _aFriedman, Arthur D. | ||
| 964 | _gCIRC | ||
| 997 | _aA114242 s C | ||
| 999 |
_c325054 _d325054 |
||