000 00457pam a2200169a 44500
008 160408bc1987 xxu||||| |||| 00| 0 eng d
020 _a0471914347
082 _a621.38152
_bAm35f
100 _aAmerasekera, E. A.
245 1 _aFAILURE MECHANISMS IN SEMICONDUCTOR DEVICES
260 _aChichester
_bWiley
_cc1987
300 _axiii,205
650 _aSemiconductors -- Defects
700 _aCampbell, D. S.
964 _gCIRC
997 _aA101665 s C
999 _c324583
_d324583