000 00506pam a2200181a 44500
008 160408bc1994 xxu||||| |||| 00| 0 eng d
020 _a0471950629
082 _a621.367
_bH363I
100 _aHeijden,Ferdin
245 1 _aIMAGE BASED MEASUREMENT SYSTEMS
_cOBJECT RECOGNITION AND PARAMETER ESTIMATION
260 _a
_bJohn Wiley, Chichester
_cc1994
300 _aviii,338
500 _aIncludes Index
650 _aPattern Recognition
700 _aVande
964 _gCIRC
997 _aA119969 s C
999 _c322895
_d322895