000			00610pam a2200193a 44500
008			160408b1991 xxu||||| |||| 00| 0 eng d
020			_a0306438240
082			_a543.08586 _bEl25
100			_aHeinrich, K. F. J.
245	1		_aELECTRON PROBE QUANTITATION
260			_aNew York _bPlenum Press _c1991
300			_aviii,400
500			_aResult Of A Gathering Of International Experts In 1988 At -- National Inst Of Standards & Technology
650			_aElectron Probe Microanalysis -- Cong
650			_aMicrochemistry -- Cong
700			_aNewbury, Dale E.
964			_gCIRC
997			_aA115697 C
999			_c322886 _d322886