000 00629pam a2200205a 44500
003 OSt
008 160408bc1994 xxu||||| |||| 00| 0 eng d
020 _a0750302941
040 _cIIT Kanpur
041 _aeng
082 _a541.377
_bD361J
245 1 _aDEFECT RECOGNITION AND IMAGE PROCESSING IN SEMICONDUCTORS AND DEVICES
_cedited by J. Jimenez
260 _bInstitute Of Physics
_cc1994
_aBristol
300 _axx,417
500 _aProc. Of The Fifth International Conference, Spain, 1993
650 _aSemiconductors -- Cong
650 _aSemiconductor Devices -- Cong
700 _aJimenez, J., [ed.]
942 _cBK
999 _c322442
_d322442