| 000 | 00507pam a2200193a 44500 | ||
|---|---|---|---|
| 008 | 160408bc1993 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0824789326 | ||
| 082 |
_a620.1127 _bSP37 |
||
| 100 | _aRajpal S. Sirohi | ||
| 245 | 1 | _aSPECKLE METROLOGY | |
| 260 |
_a _bMarcel Dekker, New York _cc1993 |
||
| 300 | _axii,551, | ||
| 440 |
_aOptical Engineering _v38 |
||
| 650 | _aNon-Destructive Testing | ||
| 650 | _aSpeckle Metrology | ||
| 700 | _aSirohi,Rajpal S. | ||
| 964 | _gCIRC | ||
| 997 | _aA118231 C | ||
| 999 |
_c317750 _d317750 |
||