000			00630pam a2200193a 44500
008			160408bc1990 xxu||||| |||| 00| 0 eng d
020			_a07923390563
082			_a621.39732 _bJ559t
100			_aJha, Niraj K.
245	1		_aTESTING AND RELIABLE DESING OF CMOS CIRCUITS
260			_aBoston _bKluwer Academic Pub. _cc1990
300			_axiii,231
650			_aMetal Oxide Semiconductors, Complementary -- Testing
650			_aMetal Oxide Semiconductros, Complementary -- Raliability
650			_aIntegrated Circuits -- Very Large Scale Integration
700			_aKundu, Sandip
964			_gCIRC
997			_aA113982 C
999			_c316885 _d316885